| Original language | English |
|---|---|
| Pages (from-to) | 79-94 |
| Journal | Quality Engineering |
| Volume | 35 |
| Issue number | 1 |
| State | Published - 2023 |
On reliability analysis of one-shot devices with manufacturing defects
- Xiangwen Shang
- , Tony Ng
- , Man Ho Ling
Research output: Contribution to journal › Article